WE-SS.2A.3

Combining Advanced Tools to Monitor RF-EMF Exposure in Next-Generation Telecommunication Networks

Sam Aerts, The Hague University of Applied Sciences, Netherlands; Joe Wiart, Télécom Paris, Institut Polytechnique de Paris, France; John Bolte, The Hague University of Applied Sciences, Netherlands
Session:
Advanced Technologies for EMF Exposure Assessment/Prediction/Monitoring Oral
Track:
Special Sessions
Location:
Teatrino: 0-18
Session Time:
Wed, 17 Jul, 08:40 - 10:20
Presentation Time:
Wed, 17 Jul, 09:20 - 09:40
Session Co-Chairs:
Sen Liu, NICT and Xingqi Zhang, University of Alberta
Presentation
Discussion
Session WE-SS.2A
WE-SS.2A.1: Predicting Electromagnetic Field (EMF) Exposure Using Heterogeneous Graph Neural Networks
Sen Liu, Teruo Onishi, Masao Taki, Soichi Watanabe, NICT, Japan
WE-SS.2A.2: A directional power monitoring and control feature for EMF product compliance of base stations
Bo Xu, Davide Colombi, Carla Di Paola, Jens Eilers Bischoff, Paramananda Joshi, Stanislav Zhekov, Christer Törnevik, Ericsson AB, Sweden
WE-SS.2A.3: Combining Advanced Tools to Monitor RF-EMF Exposure in Next-Generation Telecommunication Networks
Sam Aerts, The Hague University of Applied Sciences, Netherlands; Joe Wiart, Télécom Paris, Institut Polytechnique de Paris, France; John Bolte, The Hague University of Applied Sciences, Netherlands
WE-SS.2A.4: Fast SAR Measurement Method Based on R-U-Net
Miao Cao, Zicheng Liu, Ruijie Xiao, Northwestern Polytechnical University, China; Joe Wiart, Télécom Paris, Institut Polytechnique de Paris, France
WE-SS.2A.5: Non-intrusive polynomial chaos expansion for uncertainty quantification in specific absorption rate calculations
Yiwen Zhang, Vikass Monebhurrun, Université Paris-Saclay, France
Resources
View Manuscript