Mon, 15 Jul, 16:20 - 16:40
MO-A5.1P.8: A Bistatic Measurement Scheme for Revealing Signatures of Tree Defects in Radar B-scans
Kaixuan Cheng, Yee Hui Lee, Jiwei Qian, Bui Q. Huy, Nanyang Technological University, Singapore; Daryl Lee, Mohamed Lokman Mohd Yusof, National Parks Singapore, Singapore; Abdulkadir C. Yucel, Nanyang Technological University, Singapore