Mon, 15 Jul, 16:20 - 16:40
MO-A1.1P.8: NUIST Near-Field Scanner System Design for RF and Microwave EMC Test
Hongchuan Jia, Fayu Wan, Nanjing University of Information Science and Technology, China; Vladimir Mordachev, The Belarusian State University of Informatics and Radioelectronics, Belarus; Glauco Fontagalland, Federal University of Campina Grande, Brazil; Xiaohe Chen, China University of Petroleum, China; Blaise Ravelo, Nanjing University of Information Science and Technology, China