WE-A5.1P.7

Linear One-dimensional Inverse Profiling: the Role of a Reflecting Plane in the Background

Maria Antonia Maisto, Università della Campania, L. Vanvitelli, Italy; Loreto Di Donato, Università di Catania, Italy; Raffaele Solimene, Università della Campania, L. Vanvitelli, Italy

Session:
Focused Session on Non-destructive sensing and imaging: From mm to optical waves Oral

Track:
AP-S: Propagation and Scattering

Location:
Spadolini: 0-02

Session Time:
Wed, 17 Jul, 13:40 - 17:20
Presentation Time:
Wed, 17 Jul, 16:00 - 16:20

Session Co-Chairs:
Maria Antonia Maisto, Università degli studi della Campania, L. Vanvitelli and Loreto Di Donato, Università degli studi di Catania
Presentation
Discussion
Session WE-A5.1P
WE-A5.1P.1: Microwave Imaging of Electromagnetic Wave Absorbers in an Antenna Measurement Chamber
Quanfeng Wang, Thomas Eibert, Technical University of Munich, Germany
WE-A5.1P.2: THz Characterization of Unconventional Materials
Ilaria Catapano, CNR-IREA, Italy
WE-A5.1P.3: Additive Frequency Diverse Active Incoherent Millimeter-Wave Imaging
Jorge R. Colon-Berrios, Jeffrey A. Nanzer, Michigan State University, United States
WE-A5.1P.4: Optical-theorem-based intrusion detection and tracking in multipath environments
Edwin Marengo, Daniel Chu, Mohammadrasoul Taghavi, Zachary Spiegel, Northeastern University, United States
WE-A5.1P.5: Adaptation and performance of well-known non-linear inverse solvers in optical microscopy
Yingying Qin, Ankit Butola, Krishna Agarwal, UiT The Arctic University of Norway, Norway
WE-A5.1P.6: Space-Frequency Imaging of a Terahertz Waveguide using Synthetic Aperture Technique
Manal Ait Assou, Georges Humbert, Aurelian Crunteanu, Cyril Decroze, XLIM Research Institute, France
WE-A5.1P.7: Linear One-dimensional Inverse Profiling: the Role of a Reflecting Plane in the Background
Maria Antonia Maisto, Università della Campania, L. Vanvitelli, Italy; Loreto Di Donato, Università di Catania, Italy; Raffaele Solimene, Università della Campania, L. Vanvitelli, Italy
WE-A5.1P.8: Enhancement of Non-Destructive Measurement Resolution with Neural Networks
Ergun Simsek, Emerson Cho, University of Maryland Baltimore County, United States
WE-A5.1P.9: Liquid Classification based on MMW experiments and Multiclass SVM
Maha El Abed, Jean-Yves Dauvignac, Jérôme Lanteri, Claire Migliaccio, Université Côte d'Azur, France
WE-A5.1P.10: Speckle in Structured Light
Kedar Khare, Indian Institute of Technology Delhi, India
Resources