Xing-Yu Cheng, Can Ding, University of Technology Sydney, Australia; Richard W Ziolkowski, University of Arizona, United States

Spandan Manna, Dirk Heberling, RWTH Aachen University, Germany

Mohamed Bizan, Hassan Naseri, Peyman Pourmohammadi, Tayeb Denidni, Institut National de la Recherche Scientifique, Canada

Yen Nguyen, Payam Nayeri, California Polytechnic State University, United States

Yipei Qiao, Lei Guo, Dalian University of Technology, China; Kwok Wa Leung, City University of Hong Kong, China; Meisong Tong, Tongji University, China; Ke Wu, École Polytechnique de Montréal, Canada

Samira Mekki, University of Ferhat Abbas, Algeria; Kamil Karacuha, Istanbul Technical University, Turkey; Mohamed Lamine Bouknia, Rami Zegadi, Yamina Tighilt, University of Ferhat Abbas, Algeria; Issa Elfergani, Campus Universitário de Santiago, Portugal; Jonathan Rodriguez, University of Bradford, United Kingdom; Younes Alfitorey Mousa, Technical University of Kosice, Slovakia; Chemseddine Zebiri, University of Ferhat Abbas, Algeria

Lakshmi Kantha A C, Halappa Gajera, Dileep M K, Dept of Studies in Electronics PG Centre, India; Koushik Dutta, Netaji Subhash Engineering College, India; Raj Mittra, University of Central Florida, United States

Waled Albakosh, Rawad Asfour, Salam Khamas, The University of Sheffield, United Kingdom