Zhuohan Chen, Yuandan Dong, University of Electronic Science and Technology of China, China

Lu Yi Liu, Tongji University, China; Ajay K. Poddar, Ulrich L. Rohde, Synergy Microwave Corporation, United States; Mei Song Tong, Tongji University, China

Chu-Ting Song, Qing-Xin Chu, South China University of Technology, China

Kumud Jha, Shri Mata Vaishno Devi University, India; Satish Sharma, San Diego State University, United States

Hanane Bendjedi, University of Ferhat Abbas, Algeria; Kamil Karacuha, Istanbul Technical University, Turkey; Mohamed Lamine Bouknia, Rami Zegadi, Yamina Tighilt, University of Ferhat Abbas, Algeria; Issa Elfergani, Campus Universitário de Santiago, Portugal; Jonathan Rodriguez, University of Bradford, United Kingdom; Chemseddine Zebiri, University of Ferhat Abbas, Algeria

Ali Zidour, University of M’hamed Bougara, Algeria; Mohammad Alibakhshikenari, Universidad Carlos III de Madrid, Spain; Mouloud Ayad, University of Sétif1, Algeria; Lida Kouhalvandi, Dogus University, Turkey

Hemalatha T, Bappadittya Roy, Sri Harsha M, Uma Maheswari Y, VIT-AP University, India

Hemalatha T, Bappadittya Roy, VIT-AP University, India; Venkata Lakshmaiah Y, Narasaraopeta Engineering College, India; Uma Maheswari Y, VIT-AP University, India

Dan Ni Lin, Tongji University, China; Ajay K. Poddar, Ulrich L. Rohde, Synergy Microwave Corporation, United States; Mei Song Tong, Tongji University, China

Eugene Ngai, Hann-Jann, United States