Ying Li, Ningning Yan, Kaixue Ma, The School of Microelectronics, Tianjin University, Tianjin 300072, China, China

Shaker Alkaraki, University of Nottingham, United Kingdom; Zhishu Qu, Fudan University, China; Syeda Fizah Jilani, Aberystwyth University, United Kingdom; James R. Kelly, Queen Mary University of London, United Kingdom

Abdullah Attar, Salam Khamas, University of Sheffield, United Kingdom

Aparna V, Karthika K, Arun Kumar S, Kumaraguru College of Technology, India

Muhammad Zaka Ali, Fabrice Mfuamba Kabonzo, Mourad Nedil, School of Engineering, University of Quebec in Abitibi-Temiscamingue (UQAT), LRTCS, Canada; Ismail Ben Mabrouk, Durham University, United Kingdom; Muath Jodei Al Hasan, Al Ain University, United Arab Emirates

Massinissa Belazzoug, University Mohamed El Bachir El Ibrahimi of Bordj Bou Arreridj, Algeria; YOUCEF Braham Chaouche, University of Québec at Abitibi-Temiscamingue, Canada; Boualem Hammache, University of Constantine 1, Algeria; Idris Messaoudene, Salem TITOUNI, Rabia REBBAH, Raouf ZERROUGUI, University of Mohamed Elbachir ElIbrahimi, Algeria; Mourad Nedil, University of Québec at Abitibi-Temiscamingue, Canada

Chao You, Yejun He, Chaoyun Song, Shenzhen University, China; Yi Huang, University of Liverpool, United Kingdom

Adnan Nadeem, Frederick Research Center and Frederick University, Cyprus; Nosherwan Shoaib, National University of Sciences and Technology (NUST), Pakistan; Photos Vryonides, Frederick Research Center and Frederick University, Cyprus; Antonis Papadakis, Frederick University and KYAMOS LTD, Cyprus; Symeon Nikolaou, Frederick Research Center and Frederick University, Cyprus

Koh Hashimoto, Toshiba Corporation, Japan

Bader Alalai, Dmitry Zelenchuk, Babar Abbasi, Queens University Belfast, United Kingdom