Hao Li, Xin Guo, nanjing university of science and technology, China; Lei Zhu, University of Macau, China; wen wu, nanjing university of science and technology, China; Zhihong Feng, National Key Laboratory of Solid-State Microwave Devices and Circuits, China

Asif Bilal, UNIVERSITY OF CYPRUS, Cyprus; Abdul Quddious, Technische Universität Dresden, Germany; Atsushi Kanno, Nagoya Institute of Technology,, Japan; Tetsuya Kawanishi, Waseda University,, Japan; Marco Antoniades, Toronto Metropolitan University, Canada; Stavros Iezekiel, UNIVERSITY OF CYPRUS, Cyprus

Anastasios G. Koutinos, Constantinos L. Zekios, Stavros V. Georgakopoulos, Florida International University, United States

Emre Uzundurukan, Farooq Faisal, Abdelkader Zerfaine, Serioja Ovidiu Tatu, Tarek Djerafi, Institut national de la recherche scientifique (INRS), University of Quebec, Canada

Majid Manteghi, Virginia Tech, United States

Pengcheng Wang, Nannan Wang, Guowei Xu, Jingjing Liu, Harbin Institute of Technology, China

Jan Claudio, Rafael Medina, University of Puerto Rico at Mayagüez, United States

Fei-Yan Ji, Xiao-Hui Mao, Shan-Shan Gu, Wen-Jun Lu, Nanjing University of Posts and Telecommunications, China

Keyi Ma, University of New South Wales, Australia; John Kot, YK Engineering Research, Australia; King Yuk Chan, Rodica Ramer, University of New South Wales, Australia

Aqeela Saghir, Giorgio Giordanengo, Links Foundation, Italy; Luca Marcaccioli, Paola Farinelli, RF Microtech, Italy