Thu, 18 Jul, 15:00 - 15:20
TH-A6.3P.5: Non-Destructive Fabrication Fault Detection in Electromagnetic Designs using Machine Learning
Ravi Kumar Arya, Zhongshan Institute of Changchun University of Science and Technology, China; Aswin Chowdary, Washington University in St. Louis, United States; Pawan Kumar, Calibyte Private Limited, India; Raj Mittra, University of Central Florida, United States; Guangyi Ai, Junwei Dong, Zhongshan Institute of Changchun University of Science and Technology, China